DIGITAL INSTRUMENTS Dimension 3100 AFM Scanning Probe Microscope | Lab Equipment
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Item Id 391170
Item #: 391170
Item: DIGITAL INSTRUMENTS Dimension 3100 AFM Scanning Probe Microscope
Model #: Dimension 3100 AFM
Serial #: N/A
Year Built: N/A
Location: California
Price: $15,000.00

Description

Atomic Force Microscopy (AFM) is a high resolution scanning probe microscope with resolution on the order of sub nanometer. The AFM consist of a cantilever with a sharp tip used to scan the surface of a sample.

**Does not Include controller and software.

Specifications

Veeco Dimension 3100 AFM
Sample size 150 mm diameter 12 mm thick
Stage movement x-y 150 mm with 2 micron resolution
Video optics with zoom 150-675 micron viewing area
Piezo scan head range; 90 micron x-y and 6 micron in z
16 bits DAC giving sub nanometer resolution
Max 512 x 512 samples/image
Contact and tapping mode AFM
Conductive AFM
STM
Liquid cell

Additional Prep Fees May Apply

Shipping

Height: 50.00 in
Width: 36.00 in
Length: 35.00 in
Weight: 1000.00 lbs
Prep Fee: N/A
Registered Customers can request shipping quotes free of charge. Shipping Quotes take 1-3 Business Days to Process
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