Rudolph Auto EL III Automatic Ellipsometer 4C 7964
Multi-Wavelength Automatic Ellipsometer.
User can select between 3 wavelengths-405 nm, 546 nm, 633 nm.
Display film thickness, index order thickness or substrate N and K.
Capable of calculating the parameters for single or double absorbing films and non-absorbing films.
Model 4C
Serial No.: 7964
115V
50/60 Hz.
113 W
2 Amps
Additional Prep Fees May Apply